Hardware development
EVALUATION BOARDDownloadDec 17, 2020 Texas Instruments (TI) has expanded its high-voltage power management portfolio with the next-generation of 650-V and 600-V gallium nitride (GaN) field-effect transistors (FETs) for automotive and industrial applications. With a fast-switching, 2.2-MHz integrated gate driver, the new families of GaN FETs help engineers deliver twice the power density, achieve 99% efficiency and reduce the size. Drivers creative. LMG352xR030-Q1 650-V 30-mΩ GaN FET with Integrated Driver, Protection, and Temperature Reporting datasheet (Rev. A) Author: Texas Instruments, Incorporated SNOSD97,A Subject: Data Sheet Keywords: SNOSD97A Created Date: 4/14/2021 4:03:31 PM. Drivers ame cameras. Gallium Nitride (GaN) Solutions. Nov 09, 2020 TI introduces industry's first automotive GaN FET with integrated driver, protection and active power management Engineers can deliver twice the power density and the highest efficiency in their. Pre-production versions of the new LMG3522R030-Q1 and LMG3525R030-Q1 650-V automotive GaN FETs and evaluation modules are expected to be available for purchase on TI.com in the first quarter of.
149Description
Features
- Input voltage operates up to 600 V
- Simple open loop design to evaluate performance of LMG342XR0XX
- Single/Dual PWM input on board for PWM signal with variable dead time
- Latched over current protection function
- Convenient probe points for logic and power stage measurements with oscilloscope probes that (..)
Description
Ti Gan Fet Moi
Features
- Input voltage operates up to 600 V
- Simple open loop design to evaluate performance of LMG342XR0XX
- Single/Dual PWM input on board for PWM signal with variable dead time
- Cycle-by-cycle over current protection function
- Convenient probe points for logic and power stage measurements with oscilloscope probes (..)
Design tools & simulation
SIMULATION TOOLDownloadPSpice® for TI design and simulation toolFeatures
Ti Gan Fet Driver
- Leverages Cadence PSpice Technology
- Preinstalled library with a suite of digital models to enable worst-case timing analysis
- Dynamic updates ensure you have access to most current device models
- Optimized for simulation speed without loss of accuracy
- Supports simultaneous analysis of multiple products
- (..)
CAD/CAE symbols
Ti Gan Fet Da
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